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- 演講或講座
- 原子與分子科學研究所
- 地點
原分所浦大邦講堂 (臺大校園內)
- 演講人姓名
Prof. Jörg Enderlein (Third Institute of Physics – Biophysics, Georg August University, Göttingen, Germany)
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- 活動網址
Advanced Concepts of Super-Resolution Fluorescence Microscopy
2020-02-04 11:00 - 12:00
Abstract:
With the advent of super-resolution microscopy, the last ~25 years have seen a revolution in optical microscopy, pushing the spatial resolution capabilities of optical microscopy towards length scales that were typically accessible only by electron microscopy. In my presentation, I will give a short overview of the different principal approaches to super-resolution microscopy. I will briefly discuss the concepts of Structured Illumination Microscopy (SIM), Stimulated Emission Depletion (STED) microscopy, and Single Molecule Localization Microscopy (SMLM). Then, I will focus on two specific techniques where our group has contributed most. The first is Image Scanning Microscopy or ISM. This technique uses a simple combination of confocal microscopy with wide-field image detection for doubling the resolution of conventional microscopy. I will present the physical principals behind ISM, and the various kinds of its implementation. Meanwhile, ISM has found broad and wide applications and lies behind state-of-the-art commercial systems such as the extremely successful AiryScan microscope from Carl Zeiss Jena. The second is Metal-Induced Energy Transfer imaging or MIET imaging. I addresses the axial resolution in microscopy, which is particularly important for resolving three-dimensional structures. MIET is based on the intricate electrodynamic interaction of fluorescent emitters with metallic nanostructures. I will present the basic principles and several applications of this technique.
With the advent of super-resolution microscopy, the last ~25 years have seen a revolution in optical microscopy, pushing the spatial resolution capabilities of optical microscopy towards length scales that were typically accessible only by electron microscopy. In my presentation, I will give a short overview of the different principal approaches to super-resolution microscopy. I will briefly discuss the concepts of Structured Illumination Microscopy (SIM), Stimulated Emission Depletion (STED) microscopy, and Single Molecule Localization Microscopy (SMLM). Then, I will focus on two specific techniques where our group has contributed most. The first is Image Scanning Microscopy or ISM. This technique uses a simple combination of confocal microscopy with wide-field image detection for doubling the resolution of conventional microscopy. I will present the physical principals behind ISM, and the various kinds of its implementation. Meanwhile, ISM has found broad and wide applications and lies behind state-of-the-art commercial systems such as the extremely successful AiryScan microscope from Carl Zeiss Jena. The second is Metal-Induced Energy Transfer imaging or MIET imaging. I addresses the axial resolution in microscopy, which is particularly important for resolving three-dimensional structures. MIET is based on the intricate electrodynamic interaction of fluorescent emitters with metallic nanostructures. I will present the basic principles and several applications of this technique.
